Overview

Device Test Plan provides a mechanism for you to configure and conduct your own device test steps. It takes the advantage of the sound card’s capability of simultaneous input and output, to generate a stimulus to the Device Under Test (DUT) and acquire the response from that device at the same time. Different stimuli can be generated and the response can be analyzed in different ways. . The DUT can be marked as Pass or Fail after a sequence of test steps. Device Test Plan supports 13 instructions with corresponding parameters. Test results (e.g. Gain vs Frequency, Phase vs Frequency, etc.) can be plotted in up to 8 X-Y plots in real time.

Device Test Plan can also be used to perform other functions such as data file batch processing, batch signal event capturing and storing, etc.

The toggle button in the Instrument Toolbar is used to open or close the Device Test Plan. You can also close the Device Test Plan panel by clicking the "Close" button at its upper right corner.

Device Test Plan includes User Defined Plan and Dedicated Test Plan (e.g. LCR Meter). Unlike the User Defined Plan which is fully configurable by the user, the Dedicated Test Plan has some built-in non-configurable algorithm dedicated for testing certain types of devices. Only the User Defined Plan will be described in this chapter.

The screen layout of the Device Test Plan panel is divided into four parts: Control Bar, Result/Option Area, Process Viewer, and Step Editor.