Measurement with Multiple Test Frequencies

If you configure a LCR test plan with multiple test frequencies in multiple test steps, the averaged resistance, capacitance or inductance value will be displayed in the Result window. Some sample LCR test plans beside the default one for LCR measurements are provided under the DTP (Device Test Plan) directory of the software. These test plans (with prefix “LCR” in their file names) are configured with different test frequencies which allow you the set different measurement ranges without changing the reference resistor.

The following figure shows a measurement of a capacitor using multiple test frequencies. The X-Y Plot illustrates its impedance variation with regard to frequency.