Device Test Plan Examples
Some sample test plans are provided in the DTP directory of the software and can be used as templates. The following are two examples.
Transfer Function Measurement using Stepped Sine Signal
The following figure illustrates the transfer function (i.e. Gain and Phase Plot, or Bode Plot) of a 5513 Hz second order Butterworth low pass filter, measured using a stepped sine stimulus, with the stimulus data stored in Channel B and the response data stored in Channel A. It shows that the gain maintains at nearly 0 dB from 0 Hz to about 5513 Hz, and then start to drop down very quickly, meanwhile the phase changes gradually from 0 degree at 0 Hz towards –180 degree as the frequency goes to infinity. At the cutoff frequency 5513 Hz, the gain is about –3dB and the phase is about –90 degree.
Pass/Fail Test
The following figure illustrates a Pass/Fail test on magnitude frequency response using a stepped sine signal. The measured RMS voltage values (blue) at specified frequencies are checked against the preset high and low limits at those frequencies in order to determine “Pass” or “Fail”. The high (red) and low (black) limits are also loaded as reference in the X-Y Plot. The final result is displayed as “Pass” only if all limit checks have been passed.
| 
